Our offices will be closed from December 20, 2025 until January 4, 2026. We wish you a wonderful holiday season.

Precision in semiconductor testing from lab to production 

Microtron is the official partner of FormFactor, a global leader in probe cards, probe systems and test solutions covering the complete ic lifecycle. From research and development characterisation to high volume production, we translate advanced test technologies into practical solutions tailored to your specific application.  

  • Contact Intelligence™ for Autonomous Testing 

    Hands free operation with automatic probe to pad alignment down to 30 micrometre, even on warped wafers. Autonomous calibration monitoring enables continuous operation around the clock without operator intervention.. Autonomous Calibration monitoring ensures 24/7 operation without operator intervention. Nauwkeurige apparatuur voor het meten van elektrische en magnetische velden volgens internationale veiligheidsnormen.

  • Modular and field upgradable

    Fast reconfiguration through mechanical plate lifts and interchangeable inserts. Systems evolve with your needs thanks to field upgradable components.. Systems grow with your needs through field-upgradable components. Compact, robust devices that are easy to use on construction sites, roofs, and in buildings.

  • Extreme temperature range

     

    From cryogenic wafer probing at 4 kelvin for quantum computing to 300 degrees celsius for power device testing. Vuetrack technology automatically compensates for drift caused by temperature changes.

  • World leader in mems probe technology

    FormFactor is the largest manufacturer with more than 115 million MEMS probes produced annually. Proprietary microspring technology supports pitches down to 40 micrometre and > 250000 touchdowns on aluminium pads.

  • Broadband performance up to 250 ghz

    Infinityxf probes deliver exceptional radio frequency measurement performance up to 250 ghz. These probes were developed in collaboration with Keysight.. Laagste contact resistance (<0.05 Ω) en superior field confinement voor nauwkeurige S-parameter metingen.

  • High parallelism for volume production

    Kepler vertical probe cards enable testing of 8 to 16 devices in parallel compared to 2 to 4 devices with conventional solutions. >This significantly reduces test cost per device.

Contact microtron

FormFactor as a global reference in test and measurement technology

  • Proven innovation

    FormFactor delivers more than 115 million mems probes per year and combines hardware, software and extensive experience in autonomous test systems.

  • Smart functionality

    From broadband probing up to 250 ghz to fully automated cryogenic wafer probing at 4 kelvin, FormFactor provides advanced measurement capabilities.

  • Modular configurations

    Systems such as evolvity 300 feature quickly changeable plates and field upgradable components that allow flexible integration into existing test environments.

  • Global standard

    FormFactor is recognised by leading semiconductor companies worldwide for its reliability, accuracy and performance.

The right solution for every semiconductor test

From research and development characterisation to high volume manufacturing, the FormFactor portfolio covers probe systems, analytical probes, probe cards and quantum cryogenic solutions. Microtron supports you in selecting the optimal configuration for your application.  

More info

Where FormFactor technology makes a difference

FormFactor test solutions support innovation across a wide range of industries by enabling precise electrical measurement and in depth device characterisation.

  • Computing & AI 

    High bandwidth memory testing and gpu characterisation for next generation artificial intelligence hardware.
  • 5G & Communications 

    Radio frequency testing up to 250 ghz for next generation communication devices and infrastructure.

  • Quantum technology

    Cryogenic test solutions for qubits and quantum processors with wafer probing at ultra low temperatures.
  • Automotive

    Reliability testing for power integrated circuits, sensors and adas components in electric and autonomous vehicles.

  • Silicon Photonics 

    Combined electrical and optical test capabilities for advanced photonic devices.

  • Advanced Packaging 

    Vertical probe solutions for three dimensional stacking, tsv and chiplet testing in modern packaging architectures.

Neem contact op met Microtron